Atomic Force Microscope Leader Park Systems Sponsors Solid State Technology Magazine Webinar on Metrology Challenges and Opportunities for Semiconductor Market

Park Systems, world leader in atomic force microscopy (AFM) is sponsoring a webinar entitled Metrology Challenges and Opportunities presented by Solid State Technology Magazine on April 14, 2016 at 10am PST. Since 2007, Park has gained a reputation as the technology leader of nanoscale measurement and systems in both research and industry for the semiconductor and other industries and their impressive client list includes Harvard, Stanford, NASA, NIST, Micron, Imec, Seagate, Western Digital and IBM.

(PRWeb April 11, 2016)

Read the full story at http://www.prweb.com/releases/2016/04/prweb13327694.htm

For more information, please visit
http://www.prweb.com/releases/2016/04/prweb13327694.htm

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