SANTA CLARA, Calif.--(BUSINESS WIRE)--Agilent Technologies Inc. (NYSE: A) today announced it is collaborating with Stanford University in a research program designed to explore a new class of nanoscale devices using a combinations of the scanning probe microscope (SPM) and atomic layer deposition (ALD). The research will enable the rapid prototyping and characterization of nanoscale devices with breakthroughs in sub 10 nm scale for a wide range of applications. “The novel nanostructur
For more information, please visit
http://www.businesswire.com/news/home/20091027005094/en