Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes AFM will showcase their newly launched Park NX-TSH, the only automated Tip Scan Head for large sample analysis over 300 mm at the SEMI Technology Unites Global Summit Feb. 15-19, 2021. Park NX-TSH is for large and heavy sample flat panel display glass, 2D encoder sample and features conductive AFM for electric defect analysis by integrating a micro probe station.
(PRWeb February 18, 2021)
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